Axis BTA 2100D Manuel de l'opérateur Page 209

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2000 MS Method MS/MS Option:
Theory of Operation
Overview
This section describes the four basic operations in Saturn Ion Trap Tandem
Mass Spectrometry (MS/MS) for electron ionization (EI):
Ion formation and matrix ion ejection
Parent ion isolation
Product ion formation
Product ion mass scanning.
Chemical ionization (CI) MS/MS uses a subset of these operations.
Note that the utility of the MS/MS technique derives from the following:
optimally filling an ion trap with the selected parent ion;
obtaining qualitative structural information about the sample by forming the
product ion spectrum; and
increasing the signal-to-noise ratio by eliminating interfering matrix ions in
the product ion spectrum during isolation.
Ion Formation and Matrix Ion Ejection
Ionization of the sample and any co-eluting matrix occurs by electron ionization.
During ionization, a broadband multifrequency waveform is applied to the end
caps of the ion trap to resonantly eject ions below the specified parent ion mass.
This removes unwanted low-mass ions whose space charge would otherwise
affect the storage efficiency of the parent ion. Removal of most of the space
charge from the trap improves mass resolution in subsequent MS/MS steps.
Following ionization, a second broadband waveform is applied to the trap to eject
those ions whose masses lie above the specified parent ion mass. This removes
most of the remaining unwanted ions from the trap. There now remains in the
trap the optimum number of parent ions having the desired m/z value, along with
a few ions with values of m/z slightly above and below it.
The advantage of this two-step approach is that it only requires one calculation of
the waveforms. If subsequent adjustments are needed to accommodate changes
in mass calibration, they can be made automatically by software that
independently modulates the rf fields in each ion-ejection step.
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